ELECTRON CRYSTALLOGRAPHY
Crystal Data
Unit Cell | |
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Length ( Å ) | Angle ( ˚ ) |
a = 167 | α = 90 |
b = 167 | β = 90 |
c = 250 | γ = 120 |
Symmetry | |
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Space Group | P 3 2 1 |
Diffraction
Diffraction Experiment | ||||||||||||||
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | electron |
Refinement
Statistics | |||||||||||||||||||
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Diffraction ID | Structure Solution Method | Resolution (High) | Resolution (Low) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Work (Depositor) | R-Free (Depositor) | Mean Isotropic B | |||||||||||
ELECTRON CRYSTALLOGRAPHY | 8 |
Non-Hydrogen Atoms Used in Refinement | |
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Non-Hydrogen Atoms | Number |
Protein Atoms | 14082 |
Nucleic Acid Atoms | |
Solvent Atoms | |
Heterogen Atoms |
Sample |
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Neurospora ATPase hexamer crystal |
Sample Components |
plasma membrane proton ATPase hexameric assembly |
Specimen Preparation | |
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Sample Aggregation State | 2D ARRAY |
Vitrification Instrument | |
Cryogen Name | |
Sample Vitrification Details | 2D crystals were vitrified by immersion in liquid nitrogen |
3D Reconstruction | |
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Reconstruction Method | CRYSTALLOGRAPHY |
Number of Particles | |
Reported Resolution (Å) | 8 |
Resolution Method | |
Other Details | |
Refinement Type | |
Symmetry Type | 2D CRYSTAL |
Map-Model Fitting and Refinement | |||||
---|---|---|---|---|---|
Id | 1 | ||||
Refinement Space | REAL | ||||
Refinement Protocol | OTHER | ||||
Refinement Target | best visual fit using the program o | ||||
Overall B Value | |||||
Fitting Procedure | |||||
Details | METHOD--manual REFINEMENT PROTOCOL--manual fit |
Data Acquisition | |||||||||
---|---|---|---|---|---|---|---|---|---|
Detector Type | KODAK SO-163 FILM | ||||||||
Electron Dose (electrons/Å**2) | 25 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | 4 |
Microscope Model | JEOL 3000SFF |
Minimum Defocus (nm) | 600 |
Maximum Defocus (nm) | 1200 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | 60 |
Nominal CS | 1.6 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | |
Nominal Magnification | 50000 |
Calibrated Magnification | 50000 |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details | Images were also recorded on JEOL 2000 EX and Philips CM200 FEG electron microscopes at 80 K at a dose of 1000 e/nm**2 |
EM Software | ||
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Task | Software Package | Version |
RECONSTRUCTION | MRC |
Image Processing | ||||
---|---|---|---|---|
CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
crystallographic |