X-RAY DIFFRACTION
Crystallization
Crystalization Experiments | ||||
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ID | Method | pH | Temperature | Details |
1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 295 | 100 mM Na cacodylate, 0.2 M Ca(CH3CO2)2, 18% PEG 8000. Fully formed crystals were soaked in 2 mM K2OsO4, 5% DMSO overnight |
2 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 295 | 100 mM Na cacodylate, 0.2 M Ca(CH3CO2)2, 18% PEG 8000. Fully formed crystals were soaked in 2 mM K2OsO4, 5% DMSO overnight |
Crystal Properties | |
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Matthews coefficient | Solvent content |
2.92 | 57.93 |
2.92 | 57.93 |
Crystal Data
Unit Cell | |
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Length ( Å ) | Angle ( ˚ ) |
a = 174.522 | α = 90 |
b = 46.769 | β = 102.72 |
c = 64.761 | γ = 90 |
Symmetry | |
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Space Group | C 1 2 1 |
Diffraction
Diffraction Experiment | ||||||||||||||
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 100 | CCD | MARMOSAIC 225 mm CCD | 2015-02-19 | M | SINGLE WAVELENGTH | ||||||
2 | 2 | x-ray | 100 | CCD | MARMOSAIC 300 mm CCD | 2015-03-28 | M | SINGLE WAVELENGTH |
Radiation Source | |||||
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ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | SYNCHROTRON | APS BEAMLINE 21-ID-F | 0.979 | APS | 21-ID-F |
2 | SYNCHROTRON | APS BEAMLINE 21-ID-D | 1.140 | APS | 21-ID-D |
Data Collection
Overall | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Rpim I (All) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||
1 | 1.77 | 50 | 99.6 | 0.164 | 0.176 | 0.071 | 9.5 | 7.3 | 49646 | 22.46 |
Highest Resolution Shell | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | Rpim I (All) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||||
1 | 1.77 | 1.8 | 98 | 0.534 | 0.64 | 5.6 | 2455 |
Refinement
Statistics | |||||||||||||||||||
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Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B | |||||
X-RAY DIFFRACTION | SAD | FREE R-VALUE | 1.8 | 42.56 | 1.35 | 47035 | 2334 | 98.79 | 0.1765 | 0.1749 | 0.17 | 0.2073 | 0.21 | 29.0813 |
RMS Deviations | |
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Key | Refinement Restraint Deviation |
f_dihedral_angle_d | 9.941 |
f_angle_d | 0.906 |
f_chiral_restr | 0.063 |
f_bond_d | 0.008 |
f_plane_restr | 0.007 |
Non-Hydrogen Atoms Used in Refinement | |
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Non-Hydrogen Atoms | Number |
Protein Atoms | 3047 |
Nucleic Acid Atoms | |
Solvent Atoms | 539 |
Heterogen Atoms | 39 |
Software
Software | |
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Software Name | Purpose |
PHENIX | refinement |
HKL-2000 | data scaling |
SOLVE | phasing |
PDB_EXTRACT | data extraction |
HKL-2000 | data reduction |