ELECTRON CRYSTALLOGRAPHY
Crystallization
Crystal Properties | |
---|---|
Matthews coefficient | Solvent content |
4.2 | 71 |
Crystal Data
Unit Cell | |
---|---|
Length ( Å ) | Angle ( ˚ ) |
a = 62.45 | α = 90 |
b = 62.45 | β = 90 |
c = 100 | γ = 120 |
Symmetry | |
---|---|
Space Group | P 3 |
Diffraction
Diffraction Experiment | ||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 |
Data Collection
Refinement
Statistics | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Free (Depositor) | R-Free Selection Details | Mean Isotropic B | ||||||
ELECTRON CRYSTALLOGRAPHY | THROUGHOUT | 3 | 8 | 1 | 6107 | 358 | 73.7 | 0.237 | 0.237 | 0.33 | RANDOM | 14.2 |
RMS Deviations | |
---|---|
Key | Refinement Restraint Deviation |
x_dihedral_angle_d | 25.9 |
x_angle_deg | 1.7 |
x_improper_angle_d | 1 |
x_bond_d | 0.013 |
x_bond_d_na | |
x_bond_d_prot | |
x_angle_d | |
x_angle_d_na | |
x_angle_d_prot | |
x_angle_deg_na |
Non-Hydrogen Atoms Used in Refinement | |
---|---|
Non-Hydrogen Atoms | Number |
Protein Atoms | 1721 |
Nucleic Acid Atoms | |
Solvent Atoms | 2 |
Heterogen Atoms | 500 |
Software
Software | |
---|---|
Software Name | Purpose |
X-PLOR | model building |
X-PLOR | refinement |
X-PLOR | phasing |
Sample |
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Bacteriorhodopsin |
Specimen Preparation | |
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Sample Aggregation State | 2D ARRAY |
Embedding Material | trehalose |
Embedding Details | 3% (w/v) trehalose |
3D Reconstruction | |
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Reconstruction Method | CRYSTALLOGRAPHY |
Number of Particles | |
Reported Resolution (Å) | 3 |
Resolution Method | DIFFRACTION PATTERN/LAYERLINES |
Other Details | |
Refinement Type | |
Symmetry Type |
Data Acquisition | |||||||||
---|---|---|---|---|---|---|---|---|---|
Detector Type | GENERIC GATAN | KODAK SO-163 FILM | |||||||
Electron Dose (electrons/Å**2) | 10 | 30 |
Imaging Experiment | 1 | 2 |
---|---|---|
Date of Experiment | ||
Temperature (Kelvin) | ||
Microscope Model | JEOL 4000 | JEOL 3000SFF |
Minimum Defocus (nm) | ||
Maximum Defocus (nm) | ||
Minimum Tilt Angle (degrees) | ||
Maximum Tilt Angle (degrees) | ||
Nominal CS | ||
Imaging Mode | DIFFRACTION | BRIGHT FIELD |
Specimen Holder Model | ||
Nominal Magnification | ||
Calibrated Magnification | ||
Source | FIELD EMISSION GUN | FIELD EMISSION GUN |
Acceleration Voltage (kV) | ||
Imaging Details |
EM Software | ||
---|---|---|
Task | Software Package | Version |
CRYSTALLOGRAPHY MERGING | LATLINE | |
CRYSTALLOGRAPHY MERGING | CCP4 package | |
OTHER | MRC package | |
MODEL FITTING | O | |
MODEL REFINEMENT | X-PLOR |