8P2W | pdb_00008p2w

Structure of human SIT1 (focussed map / refinement)


ELECTRON MICROSCOPY

Starting Model(s)

Initial Refinement Model(s)
TypeSourceAccession CodeDetails
experimental modelPDB 6M18 

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d9.6251
f_angle_d0.4429
f_chiral_restr0.0385
f_plane_restr0.0029
f_bond_d0.0028
Sample
SIT1:ACE2 complex
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Detailsgrid blotted for 3sec
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles322202
Reported Resolution (Å)3.76
Resolution MethodFSC 0.143 CUT-OFF
Other DetailscryoSPARC local refinement using mask focussed on SIT1 domain using particles after symmetry expansion and 3D classification in RELION
Refinement Type
Symmetry TypePOINT
Point SymmetryC1
Map-Model Fitting and Refinement
Id1 (6M18)
Refinement SpaceREAL
Refinement ProtocolFLEXIBLE FIT
Refinement Target
Overall B Value150
Fitting Procedure
DetailsInitial model fitting was peformed in Chimera and model building in COOT
Data Acquisition
Detector TypeGATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)50.09
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)1000
Maximum Defocus (nm)2200
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC3.3.1
IMAGE ACQUISITIONSerialEM
CTF CORRECTIONcryoSPARC3.3.1
MODEL FITTINGCoot0.9.6
INITIAL EULER ASSIGNMENTcryoSPARC3.3.1
FINAL EULER ASSIGNMENTcryoSPARC3.3.1
CLASSIFICATIONRELION3.1.3
RECONSTRUCTIONcryoSPARC3.3.1
MODEL REFINEMENTPHENIX1.20_4459
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION509681