8W2Q
BsaXI-DNA complex II
ELECTRON MICROSCOPY
Refinement
RMS Deviations | |
---|---|
Key | Refinement Restraint Deviation |
f_dihedral_angle_d | 19.629 |
f_angle_d | 0.604 |
f_chiral_restr | 0.041 |
f_plane_restr | 0.004 |
f_bond_d | 0.002 |
Sample |
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Quaternary complex of RM, S and DNA complex |
Specimen Preparation | |
---|---|
Sample Aggregation State | PARTICLE |
Vitrification Instrument | FEI VITROBOT MARK IV |
Cryogen Name | ETHANE |
Sample Vitrification Details |
3D Reconstruction | |
---|---|
Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 244448 |
Reported Resolution (Å) | 3.06 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | |
Refinement Type | |
Symmetry Type | POINT |
Point Symmetry | C1 |
Map-Model Fitting and Refinement | |||||
---|---|---|---|---|---|
Id | 1 | ||||
Refinement Space | REAL | ||||
Refinement Protocol | FLEXIBLE FIT | ||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
---|---|---|---|---|---|---|---|---|---|
Detector Type | DIRECT ELECTRON DE-10 (5k x 4k) | DIRECT ELECTRON DE-20 (5k x 3k) | |||||||
Electron Dose (electrons/Å**2) | 40 | 40 |
Imaging Experiment | 1 | 2 |
---|---|---|
Date of Experiment | ||
Temperature (Kelvin) | ||
Microscope Model | FEI TALOS ARCTICA | FEI TITAN KRIOS |
Minimum Defocus (nm) | 1200 | 1200 |
Maximum Defocus (nm) | 5000 | 5000 |
Minimum Tilt Angle (degrees) | ||
Maximum Tilt Angle (degrees) | ||
Nominal CS | 2.7 | 2.7 |
Imaging Mode | BRIGHT FIELD | BRIGHT FIELD |
Specimen Holder Model | FEI TITAN KRIOS AUTOGRID HOLDER | FEI TITAN KRIOS AUTOGRID HOLDER |
Nominal Magnification | ||
Calibrated Magnification | ||
Source | FIELD EMISSION GUN | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 200 | 3000 |
Imaging Details |
EM Software | ||
---|---|---|
Task | Software Package | Version |
PARTICLE SELECTION | cryoSPARC | 3.3 |
IMAGE ACQUISITION | SerialEM | 3 |
CTF CORRECTION | cryoSPARC | 3.3 |
MODEL FITTING | Coot | 0.9.8.9.2EL |
IMAGE ACQUISITION | SerialEM | 4 |
INITIAL EULER ASSIGNMENT | cryoSPARC | 3.3 |
FINAL EULER ASSIGNMENT | cryoSPARC | 3.3 |
CLASSIFICATION | cryoSPARC | 3.3 |
RECONSTRUCTION | cryoSPARC | 3.3 |
MODEL REFINEMENT | PHENIX | 1.19.2 |
Image Processing | ||||
---|---|---|---|---|
CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
NONE |